详细信息
Tensile strain effects on C4N3H monolayer: Large Poisson's ratio and robust Dirac cone ( SCI-EXPANDED收录 EI收录)
文献类型:期刊文献
英文题名:Tensile strain effects on C4N3H monolayer: Large Poisson's ratio and robust Dirac cone
作者:Pan, Hongzhe[1];Zhang, Hongyu[2];Li, Jianfu[1];Li, Qingfang[3];Sun, Yuanyuan[1];Wei, Mingzhen[1];Zhu, Hongyang[1,4];Wang, Xiaoli[1]
机构:[1]Linyi Univ, Sch Phys & Elect Engn, Linyi 276005, Peoples R China;[2]East China Univ Sci & Technol, Dept Phys, Shanghai 200237, Peoples R China;[3]Nanjing Univ Informat Sci & Technol, Sch Phys & Optoelect Engn, Nanjing 210044, Jiangsu, Peoples R China;[4]Univ Tulsa, Dept Phys & Engn Phys, Tulsa, OK 74104 USA
年份:2019
卷号:114
期号:7
外文期刊名:APPLIED PHYSICS LETTERS
收录:;EI(收录号:20191006581071);WOS:【SCI-EXPANDED(收录号:WOS:000459554300023)】;
基金:This work was supported by the National Natural Science Foundation of China (Grant Nos. 11674144, 11304096, 11774128, 11704195, and 11547030) and the Natural Science Foundation of Shandong Province (Grant Nos. JQ201602, ZR2018MA038, ZR2017JL007, ZR2016EMM17, and ZR2018JL803).
语种:英文
外文关键词:Monolayers - Stiffness - Poisson ratio - Calculations - Electronic properties
摘要:Recently, a novel two-dimensional (2D) metal-free organic material, the C4N3H monolayer, has been proposed and predicted to be a 2D Dirac material with high Fermi velocities. Herein, we investigated its mechanical properties and tensile strain effects on its electronic properties based on first-principles calculations. We demonstrated that this material is quite soft with small stiffness constants and can sustain large strains. Compared to many other 2D materials, this material presents a remarkable elastic anisotropy and a large Poisson's ratio, which are very important for strain engineering. We also found that the Dirac cone of this material is very robust against the tensile strains and the Fermi velocity is high. The small stiffness constant, large Poisson's ratio, robust Dirac cone, and high Fermi velocity make the C4N3H monolayer a promising material in high-speed flexible electronic devices. Published under license by AIP Publishing.
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