文献类型：期刊文献

英文题名：Continuous-scan capability at SSRL and applications to X-ray diffraction

作者：Li, Chunlei[1];Kiss, Andrew M.[2];Van Campen, Douglas G.[2];Garachtchenko, Alex[2];Kolotovsky, Yuriy[2];Stone, Kevin[2];Xu, Yahong[3];Zhang, Wenjun[1,4];Corbett, Jeff[2]

机构：[1]East China Univ Sci & Technol, Shanghai, Peoples R China;[2]SLAC Natl Accelerator Lab, Menlo Pk, CA 94025 USA;[3]Donghua Univ, Shanghai, Peoples R China;[4]Univ Saskatchewan, Saskatoon, SK, Canada

年份：2016

卷号：23

起止页码：909

外文期刊名：JOURNAL OF SYNCHROTRON RADIATION

收录：;EI(收录号：20162702569254);WOS:【SCI-EXPANDED(收录号:WOS:000379954600008)】；

基金：The authors thank S. Belopolskiy for providing hardware and software support. Samples and beam time were provided by L. T. Schelhas. CL and YX acknowledge financial support from China Scholarship Council (CSC). AMK was supported by the Department of Energy, Laboratory Directed Research and Development funding, under contract DE-AC02-76SF00515.

语种：英文

外文关键词：continuous scan; step scan; X-ray diffraction; efficiency

摘要：Typical X-ray diffraction measurements are made by moving a detector to discrete positions in space and then measuring the signal at each stationary position. This step-scanning method can be time-consuming, and may induce vibrations in the measurement system when the motors are accelerated and decelerated at each position. Furthermore, diffraction information between the data points may be missed unless a fine step-scanning is used, which further increases the total measurement time. To utilize beam time efficiently, the motor acceleration and deceleration time should be minimized, and the signal-to-noise ratio should be maximized. To accomplish this, an integrated continuous-scan system was developed at the Stanford Synchrotron Radiation Light-source (SSRL). The continuous-scan system uses an in-house integrated motor controller system and counter/timer electronics. SPEC software is used to control both the hardware and data acquisition systems. The time efficiency and repeatability of the continuous-scan system were tested using X-ray diffraction from a ZnO powder and compared with the step-scan technique. Advantages and limitations of the continuous-scan system and a demonstration of variable-velocity continuous scan are discussed.