文献类型：期刊文献

英文题名：Annealing on the electrical properties of Ni0.75Mn 2.25O4 and Zn0.8Ni0.75Mn 1.45O4 NTC ceramics

作者：Zhao, Chunhua[1]; Zhao, Yongli[2]; Wang, Yiqun[1]

机构：[1] Key Laboratory for Ultrafine Materials, East China University of Science and Technology, Ministry of Education, Shanghai 200237, China; [2] College of Electronic and Electrical Engineering, Shanghai University of Engineering Science, Shanghai 201620, China

年份：2012

卷号：152

期号：7

起止页码：593

外文期刊名：Solid State Communications

收录：EI(收录号：20120814801383)

语种：英文

外文关键词：Zinc compounds - Manganese compounds - Ceramic materials - Thermogravimetric analysis - Annealing - Nickel compounds

摘要：Annealing temperatures on aging of Ni0.75Mn2.25O 4 and Zn0.8Ni0.75Mn1.45O4 NTC ceramics were investigated. Zn doping can effectively improve the electrical stability of Ni0.75Mn2.25O4. The aging values for Ni0.75Mn2.25O4 stay almost constant below 300°C, and then increase sharply from 4.7% to 32% with increasing annealing temperature from 400 to 850°C. For Zn0.8Ni0.75Mn1.45O4, the aging values are below 10% for all annealing temperatures, 150 to 850 °C. The aging phenomenon is caused by the oxygen uptake/release and the redistribution of cations/vacancies. ? 2012 Elsevier Ltd. All rights reserved.