文献类型：会议论文

英文题名：Spectroscopic ellipsometry on a novel cyanine dyes in Langmuir-Blodgett multilayers

作者：Wang, Chuang; Ma, Shihong; Zeng, Hao; Li, Jing; Chen, Liangyao; Wang, Wencheng; Tian, He

机构：[1]Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China;[2]Fudan Univ, Dept Opt Sci & Engn, State Key Lab Adv Photon Mat & Devices, Shanghai 200433, Peoples R China;[3]E China Univ Sci & Technol, Chem & Pharmaceut Inst, Shanghai 200237, Peoples R China

会议论文集：11th International Conference on Organized Molecular Films

会议日期：JUN 26-30, 2005

会议地点：Sapporo, JAPAN

语种：英文

外文关键词：spectroscopic ellipsometry; Langmuir-Blodgett film; X-ray diffraction; cyanine dye

摘要：We have investigated on cyanine dye (HQ) in Langmuir-Blodgett (LB) films by spectroscopic ellipsometer (SE) and compared the results with that obtained by using small angle X-ray diffraction (SAXD). It is found from the isotherms that there is a critical point on Langmuir films near the area 0.8 nm(2)/molecule for HQ LB films with and without Cd2+ ions, respectively and suggested that the facts should result from the phase transition due to the change of molecular tilt angle on surface of sub-phase. The refractive indexes as a function of the wavelength; are reported by the SE method using the three layers-model (air-LB film-silicon wafer) and Cauchy dispersion equation, for the first time presented in literature. The thickness of a single deposited layer is 2.45 nm on average. The thickness of per monolayer is agreement with those obtained by SAXD measurements. (c) 2005 Elsevier B.V. All rights reserved.