文献类型：期刊文献

英文题名：Critical points of Blaschke products, Riemann surfaces and von Neumann algebras

作者：Guo, Danni[1];Huang, Hansong[1];Li, Shan[2];Luo, Shuaibing[3]

机构：[1]East China Univ Sci & Technol, Sch Math, Shanghai 200237, Peoples R China;[2]Jiangsu Univ Technol, Dept Math, Changzhou 213000, Peoples R China;[3]Hunan Univ, Sch Math, Changsha 410082, Peoples R China

年份：2026

卷号：497

外文期刊名：ADVANCES IN MATHEMATICS

收录：;WOS:【SCI-EXPANDED(收录号:WOS:001762055100001)】；

基金：This work is partially supported by NSFC (12471122; 12271090; 12401157; 12271149) and Natural Science Foundation of Hunan Province (2024JJ2008) . Additional support is provided by Shanghai Center for Mathematical Sciences. The authors would like to thank the anonymous referees for their invaluable constructive comments, which have greatly improved the readability and overall quality of this paper.

语种：英文

外文关键词：Bergman space; Von Neumann algebras; Finite Blaschke products; Riemann surfaces; Critical points

摘要：In this paper we develop new techniques to analyze the analytic continuations of local inverses of a finite Blaschke product B by detecting the critical points of B. We introduce the notion of terminal branched components of Bin a uniform way to classify reducing subspaces of the multiplication operators by Blaschke products with lower order on the Bergman space. (c) 2026 Elsevier Inc. All rights are reserved, including those for text and data mining, AI training, and similar technologies.