文献类型：期刊文献

英文题名：Size Matching Criterion of High Temperature Waveguide Transducer for Quasi-Fundamental Shear Horizontal Wave

作者：Liao, Zuoyu[1];Guan, Ziqi[1];Zhang, Xin[1];Jia, Jiuhong[1];Zhang, Xiancheng[1];Tu, Shan-Tung[1]

机构：[1]East China Univ Sci & Technol, Key Lab Pressure Syst & Safety, Minist Educ, Shanghai 200237, Peoples R China

年份：2021

卷号：21

期号：15

起止页码：16721

外文期刊名：IEEE SENSORS JOURNAL

收录：;EI(收录号：20211710258278);WOS:【SCI-EXPANDED(收录号:WOS:000679541000036)】；

基金：Thiswork was supported in part by the National KeyResearch and Development Program of China under Grant 2018YFC0808800 and in part by the Shanghai Natural Science Foundation under Grant 18ZR1408800.

语种：英文

外文关键词：Strips; Transducers; Sensors; Monitoring; Semiconductor device modeling; Waveguide theory; Thickness measurement; Waveguide transducers; quasi-fundamental shear horizontal wave; matching mechanism; structural health monitoring; high temperature

摘要：Structural health monitoring is potentially useful to improve the safety of critical pressure equipment serving in high-temperature environments, which is increasingly important in the process industry. A waveguide transducer enables the long-term monitoring of these equipment using reliable ultrasonic technology. For waveguide transducers used in specially engineered projects, the matching mechanism between the piezoelectric wafer and the waveguide unit proves crucial to excite the pure quasi-fundamental shear horizontal (shorten for SH0*) wave. In the present research, the piezoelectric wafer is mounted on the end surface of the waveguide unit, and the matching criterion of the piezoelectric wafer and the waveguide unit is investigated by numerical modeling and experiments. Both experimental and simulation results show that the non-dispersive and pure SH0* wave can be generated successfully when the ratio of the wafer length to the strip width lies within the range of 0.8 to 1 and the piezoelectric wafer width is equal to the waveguide unit thickness. Moreover, waveguide transducers have been designed and applied to measure the thickness of plates in high-temperature environments according to the derived matching criterion. The results show that the transducers can measure the plate thickness with great precision that the measurement error is less than 0.05 mm. This measurement accuracy can satisfy the needs of industrial thickness measurement. Therefore, the reliability of the matching criterion has been verified, which provides a reliable theoretical guideline for the design of waveguide transducers to generate and receive quasi-fundamental shear horizontal waves.