详细信息

On Novel Methods for Characterizing the Arc/Contact Movement and Its Relation With the Current/Voltage in Low-Voltage Circuit Breaker  ( SCI-EXPANDED收录 EI收录)  

文献类型:期刊文献

英文题名:On Novel Methods for Characterizing the Arc/Contact Movement and Its Relation With the Current/Voltage in Low-Voltage Circuit Breaker

作者:Li, Chunlei[1];Wei, Dong[2];Zhang, Bing[3];Li, Jin[1];Zhang, Wenjun[1,4]

机构:[1]East China Univ Sci & Technol, Sch Mech & Power Engn, Shanghai 200237, Peoples R China;[2]Shanghai Elect Apparat Res Inst Grp Co Ltd, Dept Expt Ctr, Shanghai 200063, Peoples R China;[3]Univ Saskatchewan, Div Biomed Engn, Saskatoon, SK S7N 5A9, Canada;[4]Univ Saskatchewan, Dept Mech Engn, Saskatoon, SK S7N 5A9, Canada

年份:2017

卷号:45

期号:5

起止页码:882

外文期刊名:IEEE TRANSACTIONS ON PLASMA SCIENCE

收录:;EI(收录号:20171503555290);WOS:【SCI-EXPANDED(收录号:WOS:000401087200014)】;

基金:This work was supported by the China Scholarship Council, National Nature Science Foundation of China under Grant 51375166. (Corresponding authors: Jin Li; Wenjun Zhang.)

语种:英文

外文关键词:Arc current measurement; high-speed camera; miniature circuit breaker (MCB); simultaneous trigger; synchronization error

摘要:This paper presents a work that was aimed to develop methods along with test facilities for characterizing the arc/contact movement in low-voltage miniature circuit breaker which has a related current under 125 A, and to find its relation with the short-circuit current/voltage in the circuit. The method consists of: 1) the high-speed camera for obtaining the image of the arc or contact movement; 2) the data acquisition system that measures the current during the short-circuit break; and 3) the circuitry system that establishes the synchronization of the arc movement capturing and the current acquisition. In particular, two methods were developed for this purpose: one based on analog signal and the other based on digital signal. The experiment shows that the accuracy of the synchronization, dependent on the sampling rate of the high-speed camera, is about from tens of microseconds to hundreds of microseconds with both methods. The two methods have their own advantages and disadvantages, and they can be tailored to applications for the best performance.

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