文献类型：期刊文献

英文题名：Annealing on the electrical properties of Ni_0.75Mn_2.25O₄ and Zn_0.8Ni_0.75Mn_1.45O₄ NTC ceramics

作者：Zhao, Chunhua[1];Zhao, Yongli[2];Wang, Yiqun[1]

机构：[1]E China Univ Sci & Technol, Minist Educ, Sch Mat Sci & Engn, Key Lab Ultrafine Mat, Shanghai 200237, Peoples R China;[2]Shanghai Univ Engn Sci, Coll Elect & Elect Engn, Shanghai 201620, Peoples R China

年份：2012

卷号：152

期号：7

起止页码：593

外文期刊名：SOLID STATE COMMUNICATIONS

收录：;WOS:【SCI-EXPANDED(收录号:WOS:000301913500007)】；

基金：This work is supported by National Natural Science Foundation of China (Grant No.: 51102094), Research Fund for the Doctoral Program of Higher Education of China (Grant No.: 20110074120013), Visiting Scholar Foundation of The Key Laboratory for Ultrafine Materials of The Ministry of Education, and Youth foundation of ECUST.

语种：英文

外文关键词：Ceramics; Electrical property; X-ray diffraction; Thermogravimetric analyses

摘要：Annealing temperatures on aging of Ni0.75Mn2.25O4 and Zn0.8Ni0.75Mn1.45O4 NTC ceramics were investigated. Zn doping can effectively improve the electrical stability of Ni0.75Mn2.25O4. The aging values for Ni0.75Mn2.25O4 stay almost constant below 300 degrees C, and then increase sharply from 4.7% to 32% with increasing annealing temperature from 400 to 850 degrees C. For Zn0.8Ni0.75Mn1.45O4, the aging values are below 10% for all annealing temperatures, 150 to 850 degrees C. The aging phenomenon is caused by the oxygen uptake/release and the redistribution of cations/vacancies. (C) 2012 Elsevier Ltd. All rights reserved.