文献类型：期刊文献

英文题名：Preparation of a high-concentration nm-size ceramic silicon carbide slurry for the ICP-OES determination of ultra-trace impurities in a sample

作者：Wang, Zheng[1,2];Zhang, Junye[1,3];Qiu, Deren[2];Zou, Huijun[1];Qu, Haiyun[1];Chen, Yirui[1];Yang, Pengyuan[2]

机构：[1]Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 200050, Peoples R China;[2]Fudan Univ, Dept Chem, Shanghai 200433, Peoples R China;[3]E China Univ Sci & Technol, Sch Chem & Mol Engn, Shanghai 200237, Peoples R China

年份：2010

卷号：25

期号：9

起止页码：1482

外文期刊名：JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

收录：;EI(收录号：20103413183367);WOS:【SCI-EXPANDED(收录号:WOS:000281109600016)】；

基金：The financial support of NSFC (20705036), the Shanghai Committee of Science and Technology (08142201500), and the Plan of Creative Funding (SCX0626) is highly acknowledged.

语种：英文

外文关键词：Ceramic materials - Viscosity measurement - Trace elements - Impurities - Trace analysis - Viscosity

摘要：A high-concentration with low viscosity ceramic silicon carbide (SiC) slurry prepared for ICP-OES determination of ultra-trace impurities is described in this paper. Good fluidity can be kept up to the slurry concentration as high as 30% (m v(-1)) by adding 2% polyethylene imine (PEI) as a dispersant at pH 4.0. Stability of the high content slurry of nm-size SiC is characterized by zeta potential measurement and viscosity measurement, and medium pH is experimentally optimized. The analysis can be calibrated using simple aqueous standards in case a high-concentration slurry is nebulized. Owing to extremely low blanks and unusually highly slurry concentration (20% m v(-1)), extraordinarily low limits of detection ranging from 2 (Mn, Ti) to 100 (Al) ng g(-1) could be achieved.