文献类型：期刊文献

英文题名：Morphology of the silver iodobromide T-grain crystal surface

作者：Cao, LZ; Liang, XC; Jiao, JJ; Zhuang, SY

机构：[1]E China Univ Sci & Technol, Inst Fine Chem, Shanghai 200237, Peoples R China

年份：2005

卷号：26

期号：1

起止页码：142

外文期刊名：CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE

收录：;EI(收录号：2005209109635);WOS:【SCI-EXPANDED(收录号:WOS:000226503000036)】；

语种：英文

外文关键词：AFM; T-grain crystal; surface morphology; shallow electron trapping dopant

摘要：The morphologies of the silver iodobromide T-grain crystal surface, the doped emulsion crystal surface with the dopant K-4[Ru(CN)(6)] and the sulfur plus gold sensitized doped emulsion crystal surface were observed. The effects of the light exposure on above crystal surfaces were also studied with AFM. The results show that while the grain surfaces appear to be flat when observed with a common electron microscope or an atomic force microscope with a low resolution power many hills were revealed on the crystal surface with a high resolution power. After exposure the in situ observation showed that both the heights and sizes of the hills increased. The dopant might affect the amount of the hills. After sulfur plus gold sensitization, the arrangement of the hills turned more regular.