详细信息
MEMS-based dual temperature control measurement method for thermoelectric properties of individual nanowires ( SCI-EXPANDED收录 EI收录)
文献类型:期刊文献
英文题名:MEMS-based dual temperature control measurement method for thermoelectric properties of individual nanowires
作者:Cui, Yan[1];Yang, Yang[2];Liu, Shuai[3];Dai, Sheng[1];Li, Tie[2];Wang, Yuelin[2]
机构:[1]East China Univ Sci & Technol, Inst Fine Chem, Sch Chem & Mol Engn, Key Lab Adv Mat & Feringa Nobel Prize Scientist J, Shanghai 200237, Peoples R China;[2]Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Sci & Technol Micro Syst Lab, Shanghai 200050, Peoples R China;[3]Xian Shiyou Univ, Coll Sci, Xian 710065, Shaanxi, Peoples R China
年份:2020
卷号:10
期号:4
起止页码:620
外文期刊名:MRS COMMUNICATIONS
收录:;EI(收录号:20204209344399);WOS:【SCI-EXPANDED(收录号:WOS:000597865400013)】;
基金:This work was supported by the National Key Research and Development Program of China (Nos. 2017YFA0207103 and 2018YFA0208503) and sponsored by Shanghai Sailing Program (20YF1409600). Additional support was provided by the Feringa Nobel Prize Scientist Joint Research Center.
语种:英文
外文关键词:Thermoelectric equipment - Thermoelectricity - Thermometers - Thermal conductivity - MEMS - Temperature control - Vanadium dioxide
摘要:The development of thermoelectric measurement technology at nanoscale is a challenging task. Here, a novel MEMS-based dual temperature control (DTC) measurement method for thermoelectric properties of individual nanowires was proposed. Different from conventional thermal bridge testing devices, this DTC thermoelectric testing device can obtain the thermoelectric properties by independently control ambient temperature and temperature difference between two ends of the nanowires through two separate resistance thermometers without auxiliary heating devices. The reliability of the model and the testing accuracy were verified by accurately measuring the thermal conductivity, electrical conductivity, and the absolute value of the Seebeck coefficient of VO2 nanowires.
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