文献类型：期刊文献

英文题名：Critical Excitation of the Fundamental Quasi-Shear Mode Wave in Waveguide Bars for Elevated Temperature Applications

作者：Jia, Jiuhong[1];Liao, Zuoyu[1];Cai, Xiaotao[1];Tu, Yun[1];Tu, Shan-Tung[1]

机构：[1]East China Univ Sci & Technol, Key Lab Pressure Syst & Safety, Minist Educ, Shanghai 200237, Peoples R China

年份：2019

卷号：19

期号：4

外文期刊名：SENSORS

收录：;EI(收录号：20191006612840);WOS:【SCI-EXPANDED(收录号:WOS:000460829200044)】；

基金：This research was funded by the National Key R&D Program of China (No. 2018YFC0808800), the Shanghai Natural Science Foundation (No. 18ZR1408800) and the Natural Science Foundation of China (No. 51505150).

语种：英文

外文关键词：guided wave; fundamental shear horizontal wave; waveguide bar; anti-plane shear line source; nondestructive testing

摘要：The safety of critical pressure equipment in elevated temperature is increasingly important. Moreover, the on-line monitoring method is potentially useful to improve their safety. A waveguide bar system can enable monitoring of critical equipment working in elevated temperature using reliable ultrasonic technology. Among the waveguide bar system, the matching mechanism of the transducer and the waveguide bar is crucial to propagate the pure fundamental quasi-shear mode (shorten for SH0*) wave. In the present research, the loading line sources that can excite pure SH0* wave are investigated and the anti-plane shear loading source is selected. The critical values about the geometric dimensions of the junctions between the piezoelectric transducer and the waveguide bar are explored by simulation and experiments. On the condition that the excitation sources satisfy the critical values, the loading can be approximated to an anti-plane shear one to excite the pure SH0* wave. Some waveguide bar systems are designed based on the simulated critical values and some experiments at high temperature are carried out. The experimental results verify that the designed waveguide bar systems can excite the pure SH0* wave at elevated temperatures, which verify the reliability of the simulated critical results.