文献类型：专利

英文题名：Method for locating defect plate based on forward scattering wave and C-mean clustering algorithm, involves obtaining straight lines of intersection point by C-mean clustering algorithm, clustering center is obtained as defect position

作者：ZHOU S;DI S;CHEN S;LI Y;YANG B;ZHANG N;LIU W

机构：[1]UNIV EAST CHINA SCI & TECHNOLOGY

申请号：CN106990169-A

申请日：2017-04-11

公开日：2017-07-28

语种：英文

收录：DERWENT

摘要：NOVELTY - The method involves extracting a direct wave differential envelope from a difference signal envelope to measure a magnitude of the direct wave difference corresponding to maximum amplitude of a direct wave difference envelope. Each sensor is obtained as an excitation sensor. A sensor pair is connected with a largest two sets of detection data. The sensor pairs are connected by a straight line to obtain lines. A clustering center of an intersection point of straight lines are obtained by a C-mean clustering algorithm. The clustering center is obtained as a defect position. USE - Method for locating defect plate based on forward scattering wave and C-mean clustering algorithm. ADVANTAGE - The method enables high positioning accuracy and plate locating process in simple manner. DESCRIPTION OF DRAWING(S) - The drawing shows a flow diagram illustrating a method for locating defect plate based on forward scattering wave and C-mean clustering algorithm. '(Drawing includes non-English language text)'