文献类型：期刊文献

中文题名：AFM研究Sol-Gel法制备的TiO_2和Al_2O_3-TiO_2-SiO_2涂膜表面形貌

英文题名：Study of the Surface Topography of TiO 2 andAl 2O 3 TiO 2 SiO 2 Coatings on Glass with Atomic Force Microscopy

作者：杜永娟[1]

机构：[1]华东理工大学无机材料系

年份：1998

卷号：24

期号：4

起止页码：453

中文期刊名：华东理工大学学报（自然科学版）

外文期刊名：Journal of East China University of Science and Technology

收录：CSTPCD;;Scopus;北大核心:【北大核心1996】；CSCD:【CSCD2011_2012】；

语种：中文

中文关键词：表面形貌;玻璃;涂膜;溶胶-凝胶法;原子力显微镜

外文关键词：surface nanoscale topography; TiO 2 coatings; Al 2O 3 TiO 2 SiO 2 coatings; atomic force microscopy; crystallization of anatase; sol gel method

摘要：载玻片在金属醇化物的溶胶中浸涂、热处理，获得厚度为５０～９０ｎｍ的ＴｉＯ２和ＸＡｌ２Ｏ３－ＹＴｉＯ２－ＺＳｉＯ２涂膜（Ｘ＝０～３０，Ｙ＝０．２５～０．６０，Ｚ＝０．２０～０．６５，摩尔分数）。使用原子力显微镜（ＡＦＭ）研究涂膜表面纳米范围的形貌。研讨了化学组成，热处理温度与时间，以及热处理前或后的贮存史对表面形貌，ｒｍｓ－均方根粗糙度和锐钛矿结晶的影响。
TiO 2 and X Al 2O 3 Y TiO 2 Z SiO 2 coatings( X =0￣0.30, Y =0.25￣0.60, Z = 0.20 ￣0.65 molar fraction) with thickness of 50￣90nm were prepared on microscope glasses by dip coating using an alkoxide base sol gel method. Their surface nanoscale topography was studied using atomic force microscopy(AFM). The effects of chemical compositions, heat treatments and the storage process in air before and after the heat treatment on the surface topography, the rms roughness and the crystallization of anatase were studied and discussed.