文献类型：期刊文献

英文题名：Ion-induced field screening as a dominant factor in perovskite solar cell operational stability

作者：Thiesbrummel, Jarla[1,2];Shah, Sahil[1];Gutierrez-Partida, Emilio[1];Zu, Fengshuo[3,4];Pena-Camargo, Francisco[1];Zeiske, Stefan[5];Diekmann, Jonas[1];Ye, Fangyuan[1,6,7];Peters, Karol P.[1];Brinkmann, Kai O.[8,9];Caprioglio, Pietro[2];Dasgupta, Akash[2];Seo, Seongrok[2];Adeleye, Fatai A.[1];Warby, Jonathan[1];Jeangros, Quentin[10];Lang, Felix[1];Zhang, Shuo[6];Albrecht, Steve[7];Riedl, Thomas[8,9];Armin, Ardalan[5];Neher, Dieter[1];Koch, Norbert[3,4,11];Wu, Yongzhen[6];Le Corre, Vincent M.[12];Snaith, Henry[2];Stolterfoht, Martin[1,13]

机构：[1]Univ Potsdam, Inst Phys & Astron, Phys & Optoelekt weicher Materie, Potsdam, Germany;[2]Univ Oxford, Clarendon Lab, Oxford, England;[3]Humboldt Univ, Inst Phys, Berlin, Germany;[4]Humboldt Univ, IRIS Adlershof, Berlin, Germany;[5]Swansea Univ, Dept Phys, Swansea, Wales;[6]East China Univ Sci & Technol, Inst Fine Chem, Shanghai, Peoples R China;[7]Helmholtz Zentrum Berlin Mat & Energie GmbH, Young Investigator Grp Perovskite Tandem Solar Cel, Berlin, Germany;[8]Univ Wuppertal, Inst Elect Devices, Wuppertal, Germany;[9]Univ Wuppertal, Wuppertal Ctr Smart Mat & Syst, Wuppertal, Germany;[10]Ctr Suisse Elect & Microtech, Neuchatel, Switzerland;[11]Helmholtz Zentrum Berlin Mat & Energie GmbH, Berlin, Germany;[12]Friedrich Alexander Univ Erlangen Nurnberg, Inst Mat Elect & Energy Technol, Erlangen, Germany;[13]Chinese Univ Hong Kong, Elect Engn Dept, Hong Kong, Peoples R China

年份：2024

卷号：9

期号：6

起止页码：664

外文期刊名：NATURE ENERGY

收录：;EI(收录号：20241315829970);WOS:【SCI-EXPANDED(收录号:WOS:001194849700003)】；

基金：Open access funding provided by Universitat Potsdam.

语种：英文

外文关键词：Efficiency - Ions - Metal halides - Open circuit voltage - Perovskite

摘要：The presence of mobile ions in metal halide perovskites has been shown to adversely affect the intrinsic stability of perovskite solar cells (PSCs). However, the actual contribution of mobile ions to the total degradation loss compared with other factors such as trap-assisted recombination remains poorly understood. Here we reveal that mobile ion-induced internal field screening is the dominant factor in the degradation of PSCs under operational conditions. The increased field screening leads to a decrease in the steady-state efficiency, often owing to a large reduction in the current density. Instead, the efficiency at high scan speeds (>1,000 V s(-1)), where the ions are immobilized, is much less affected. We also show that the bulk and interface quality do not degrade upon ageing, yet the open-circuit voltage decreases owing to an increase in the mobile ion density. This work reveals the importance of ionic losses for intrinsic PSC degradation before chemical or extrinsic mechanical effects manifest.