详细信息
Effect of the interface glass on electrical performance of screen printed Ag thick-film contacts of Si solar cells ( SCI-EXPANDED收录 EI收录)
文献类型:期刊文献
英文题名:Effect of the interface glass on electrical performance of screen printed Ag thick-film contacts of Si solar cells
作者:Zhang, Yaping[1];Yang, Yunxia[1];Zheng, Jianhua[1];Chen, Guorong[1];Cheng, Chen;Hwang, James C. M.[2];Ooi, Boon S.[2];Kovalskiy, Andriy[3];Jain, Himanshu[3]
机构:[1]E China Univ Sci & Technol, Key Lab Ultrafine Mat, Minist Educ, Sch Mat Sci & Engn, Shanghai 200237, Peoples R China;[2]Lehigh Univ, Dept Eelectr Engn, Ctr Opt Technol, Bethlehem, PA 18015 USA;[3]Lehigh Univ, Dept Mat Sci & Engn, Int Mat Inst New Funct Glass, Bethlehem, PA 18015 USA
年份:2010
卷号:518
期号:24
起止页码:E111
外文期刊名:THIN SOLID FILMS
收录:;EI(收录号:20104113286677);WOS:【SCI-EXPANDED(收录号:WOS:000295942000029)】;
基金:This work was supported by the Science and Technology Commission of Shanghai (project 05dz12019). We thank Shanghai Perfect Energy Co., Ltd. for the help in the fabrication of test cells. YZ also thanks the NSF's IMI-NFG for the exchange visit (DMR-0409588).
语种:英文
外文关键词:Glass; Barrier; Ag/Si contacts; Photovoltaic; Polycrystalline Si
摘要:Glasses with compositions (40-x)PbO-xZnO-60(B2O3-SiO2) (x= 5, 10, 15, 20) have been prepared. Substitution of ZnO for PbO increased glass bandgap (E-g) and crystallization ability greatly. Crystalline phases of bulk glasses after rapid thermal processing (RTP) were identified by X-ray diffraction (XRD). Transmission line model (TLM) was employed to measure the electrical performance of Ag electrodes screen printed on polycrystalline Si substrates using Ag thick-film pastes and by RTP. The conductivity (sigma) decreased while specific contact resistance (rho(c)) was not monotonic varied with increasing ZnO content. The correlation between electrical performance and glass barrier formed on the Ag gridline and Si emitter interface has been investigated. (C) 2010 Elsevier B.V. All rights reserved.
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