文献类型：期刊文献

中文题名：3σ方法在磁记忆检测中的应用

英文题名：Application of the 3σ Method in Magnetic Memory Testing

作者：李光霁[1];孙国豪[1];潘家祯[1]

机构：[1]华东理工大学机械与动力工程学院,上海200237

年份：2007

卷号：33

期号：5

起止页码：726

中文期刊名：华东理工大学学报（自然科学版）

外文期刊名：Journal of East China University of Science and Technology

收录：CSTPCD;;EI(收录号：20074710937366);Scopus;北大核心:【北大核心2004】；CSCD:【CSCD2011_2012】；

语种：中文

中文关键词：磁记忆检测;漏磁场;3σ理论

外文关键词：magnetic memory testing; magnetic leakage field; theory of 3σ

摘要：通过对带有已知预制裂纹试块的检测曲线进行分析,提出了一种评定应力集中的方法——3σ方法。如果x服从正态分布,式μ=x±3σ具有概率含义:测定结果x落在(μ-3σ,μ+3σ)区间的概率为99.73%,概率不随σ的改变而改变。如果磁场强度变化曲线在(?μ-3σ?,+∞)内,就认为此部位有应力集中。3σ方法更加符合统计学规律,对缺陷的判断也更符合实际情况。
This paper proposed a method to determine the stress concentration based on analysis of the testing curves of plates with prefabricated flaws. This method is based on the statistical theory. If x obeys the normal distribution,μ = x ± 3σ has probable meaning . It means that if x falls on interval （μ- 3σ, μ＋3σ）, the probability is 99.73%. During the magnetic memory testing, if the strength of magnetic field is within （ ｜ μ-3σ ｜ , ＋∞）, it means there are stress concentration in this area. It is more accurate to find defects by the sensitive way to find the stress concentration.