文献类型：会议论文

英文题名：Numerical Study on Damage Phenomenon induced by Transient Stimulated Brillouin Scattering

作者：Ge, Ziming[1];Lu, Zhiwei[2];Guan, Zhijin[3];Gao, Ruijun[1];Luo, Youhua[1]

机构：[1]E China Univ Sci & Technol, Dept Phys, 130 Meilong Rd, Shanghai 200237, Peoples R China;[2]Harbin Inst Technol, Inst Optoelect, Harbin 150001, Peoples R China;[3]Nantong Univ, Coll Comp Sci & Technol, Nantong 226019, Peoples R China

会议论文集：8th Pacific Rim Conference on Lasers and Electro-Optics

会议日期：AUG 30-SEP 03, 2009

会议地点：Shanghai, PEOPLES R CHINA

语种：英文

外文关键词：SBS; electrostrictive constant; lifetime of phonon

摘要：The ultrasonic intensities in the optical components induced by the transient stimulated Brillouin scattering are calculated Through numerical study, the dependence of influence induced by SBS procession on parameters of medium are investigated