文献类型：期刊文献

英文题名：In Situ SEM Compression Study on Micro-mechanical Behavior of Electron Beam Melted Ti-6Al-4V Alloy

作者：Li, Zhenkai[1]; Yan, Yabin[1]

机构：[1] School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai, 200237, China

年份：2023

卷号：2553

期号：1

外文期刊名：Journal of Physics: Conference Series

收录：EI(收录号：20233614675509)

语种：英文

外文关键词：Backscattering - Compression testing - Electron beams - Electrons - Scanning electron microscopy - Ternary alloys - Titanium alloys - Yield stress

摘要：To investigate the mechanical properties of electron beam melted (EBM) Ti-6Al-4V alloy at the microscale, a series of in situ scanning electron microscope (SEM) compression experiments were performed in the current study. Firstly, a reconstruction of the original β phase of Ti-6Al-4V alloy was conducted using electron backscattering diffraction (EBSD) analysis. Micro-pillars were subsequently fabricated with a diameter of 2 μm within the same original β phase grain, and yield strength was measured using an in-situ mechanical compression device. The mechanical response of each micro-pillar was found to vary, and potential reasons for this phenomenon were discussed, including the impact of α-phase and β-dispersion on the material's mechanical properties. Moreover, a clear size effect was observed when comparing the yield strength of the bulk material. Furthermore, the plastic deformation behavior of Ti-6Al-4V alloy was also investigated through compression tests on the micro-pillars. ? Published under licence by IOP Publishing Ltd.