文献类型：期刊文献

英文题名：Simplified detection method of the rear-side weak soldering for monofacial solar cell using electroluminescence quantitative technology

作者：Lu, Minglei[1];Hao, Guoqiang[1];Ye, Xiaojun[1];Peng, Cihua[2];Liu, Cui[1];Li, Hongbo[1]

机构：[1]East China Univ Sci & Technol, Sch Mat Sci & Engn, Shanghai 200237, Peoples R China;[2]Shanghai Solar Energy Soc, Shanghai 200030, Peoples R China

年份：2021

卷号：127

期号：5

外文期刊名：APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

收录：;EI(收录号：20211810270706);WOS:【SCI-EXPANDED(收录号:WOS:000681060600003)】；

基金：The work is financially supported by the National Key R&D Program of China (2018YFB1500903); and Shanghai Science and Technology Committee Project (20dz1206309).

语种：英文

外文关键词：Photovoltaic module; Electroluminescence; Weak soldering; Quantitative analysis

摘要：In the series soldering step of photovoltaic module manufacturing process, soldering could be occasionally found weak or missing between busbar and interconnection ribbon. The affected modules have local heating phenomenon in application, which aggravates modules efficiency degradation. Electroluminescence (EL) technology can detect many module defect types including weak soldering. But the grayscale change of EL image is not obvious enough caused by rear-side weak soldering (RWS) compared with front-side weak soldering, especially for monofacial solar cell. RWS is difficult for manual qualitative identification. In this paper, we use EL quantitative technology and simply define deviation percentage (S-i) to distinguish types of weak soldering. RWS can be effectively detected through grayscale analysis of EL images under two different bias current conditions, which is verified by experiments and simulation. Further simulation results suggest that higher rear-side lateral resistance leads to lower S-i of RWS. This method is instructive for the automatic EL detection in module production line.