文献类型：会议论文

英文题名：Path Reduction of Multiple Test Points in Dynamic Symbolic Execution

作者：Lu, Jiawen[1,2];Cai, Lizhi[1,2];Zhang, Yang[1,2]

机构：[1]East China Univ Sci & Technol, Sch Informat Sci & Engn, Shanghai, Peoples R China;[2]Shanghai Dev Ctr Comp Software Technol, Lab Comp Software Testing & Evaluat, Shanghai, Peoples R China

会议论文集：16th IEEE/ACIS International Conference on Computer and Information Science (ICIS)

会议日期：MAY 24-26, 2017

会议地点：Wuhan Univ, Wuhan, PEOPLES R CHINA

主办单位：Wuhan Univ

语种：英文

外文关键词：DSE; decision dependence; path reduction; test point

摘要：Dynamic symbolic execution (DSE) is widely used to generate test cases for automated test. However, the practicability of DSE is greatly decreased by path explosion, which is an unavoidable challenge caused by that the number of execution paths increases exponentially with the increase in the size of program. To alleviate this problem, dynamic symbolic execution based on multiple test points (MPDSE) is proposed in this paper to improve the efficiency of DSE by reducing redundant paths. Through analyzing the dependences between test points and branches, the equivalent paths are figured out so that MPDSE can eliminate exploring redundant paths. Our experiments show that MPDSE has advantages in generating test cases compared to traditional DSE.