文献类型：期刊文献

中文题名：XPS在YAG:Ce^(3+)荧光粉中Ce^(3+)半定量分析方面的应用

英文题名：Application of XPS in Semi-quantitative Estimation of Ce^(3+) in YAG:Ce^(3+) Phosphor

作者：王廉明[1];庄李强[1];黄月霞[1];王德强[1]

机构：[1]华东理工大学材料科学与工程学院,上海200237

年份：2015

卷号：41

期号：4

起止页码：484

中文期刊名：华东理工大学学报（自然科学版）

外文期刊名：Journal of East China University of Science and Technology

收录：CSTPCD;;Scopus;北大核心:【北大核心2014】；CSCD:【CSCD2015_2016】；

语种：中文

中文关键词：YAG:Ce3+荧光粉;半定量分析;发光强度;Ce3+相对含量;XPS

外文关键词：YAG： Ce3＋ phosphor ; semi-quantitative estimation; luminescence; relative percentage of C33＋ XPS

摘要：利用XPS测试方法对YAG:Ce3+荧光粉中的Ce3+含量进行了半定量分析,为研究Ce3+含量与YAG:Ce3+荧光粉发光强度的关系,在不同的烧结气氛下制备了一系列YAG:Ce3+荧光粉样品。通过分峰拟合计算可知,在4种不同的制备条件下,Ce3+的相对含量(fCe3+,用Ce3+峰面积与Ce3++Ce4+峰面积之比来估算)分别是88.46%,77.55%,75.33%和68.14%,所对应的烧结气氛依次为CO和N2的混合气氛、CO气氛、N2气氛和空气烧结气氛。YAG:Ce3+荧光粉的发光强度随着Ce3+相对含量的增加有显著增强。
XPS analysis is used to determine the percentage of Ce3＋ in YAG.Ce3＋ phosphor as a semi quantitative method. In order to confirm the relationship between the luminescence and the percentage of Cea＋ more clearly, a series of YAG：Ce3＋ phosphors were prepared under different sintering atmospheres. The results indicate that the relative percentages of Ce3＋ （fee3＋ , estimated as peak area of Ce3＋ to Ce3＋ ＋ Ce4＋ ） are 88.46%, 77.55%, 75.33% and 68.14%, respectively, corresponding to CO ＋ N2 ,CO,N2 and air atmosphere by means of peak separation and fitting. The emission intensity of YAG. Ce3＋ increased significantly with increasing Ce3＋ concentration.