详细信息

Calculation of profile error for complex surface  ( SCI-EXPANDED收录 EI收录)  

文献类型:期刊文献

英文题名:Calculation of profile error for complex surface

作者:Liu, Jing[1]

机构:[1]E China Univ Sci & Technol, Sch Mech & Power Engn, Shanghai 200237, Peoples R China

年份:2014

卷号:48

期号:1

起止页码:183

外文期刊名:MEASUREMENT

收录:;EI(收录号:20135017071801);WOS:【SCI-EXPANDED(收录号:WOS:000329207400021)】;

语种:英文

外文关键词:Profile error; Linear quadtree; Rough localization; Accurate registration

摘要:Evaluation of profile error is important in manufacturing and detection of complex surface. In this paper, an algorithm is presented to calculate surface profile error accurately based on linear quadtree after rough localization and accurate registration. In rough localization, the best transformation is selected from four transformations. Then two algorithms are adopted to realize accurate registration and comparison is performed. One algorithm is the combination of LM algorithm and ICP algorithm. The other algorithm is BFGS algorithm. Experiment result shows that complex surface profile error is evaluated effectively through the proposed algorithm. (C) 2013 Elsevier Ltd. All rights reserved.

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