文献类型：专利

英文题名：Method for measuring distance between two crystal surface structures, involves obtaining space geometrical theory according to crystal surface structures, and obtaining distance measuring result according to dual-output structure

作者：DING P;GONG X;GUO Y;LU G;WANG H;WANG Y;WANG J;CAO X;HU P

机构：[1]UNIV EAST CHINA SCI & TECHNOLOGY

申请号：CN104915473-A

申请日：2015-05-15

公开日：2015-09-16

语种：英文

收录：DERWENT

摘要：NOVELTY - The method involves obtaining space geometrical theory according to two crystal surface structures. Measuring information and processing information are obtained. A distance measuring result is obtained according to a dual-output structure. An M-represents grid point is adjusted according to the X-axis direction. An N-represents grid point is adjusted according to the Y-axis direction. USE - Method for measuring distance between two crystal surface structures. DESCRIPTION OF DRAWING(S) - The drawing shows a flowchart illustrating a method for measuring distance between two crystal surface structures. '(Drawing includes non-English language text)'