文献类型：期刊文献

英文题名：Numerical study on damage phenomenon induced by transient stimulated brillouin scattering

作者：Ge, Ziming[1]; Lü, Zhiwei[2]; Guan, Zhijin[3]; Gao, Ruijun[1]; Luo, Youhua[1]

机构：[1] Department of Physics, East China University of Science and Technology, No. 130, Meilong Road, Xuhui District, Shanghai 200237, China; [2] Institute of Opto-Electronics, Harbin Institute of Technology, Harbin, 150001, China; [3] College of Computer Science and Technology, Nantong University, Nantong, Jiangsu 226019, China

年份：2009

外文期刊名：Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

收录：EI(收录号：20095012544471)

语种：英文

外文关键词：Optoelectronic devices

摘要：The ultrasonic intensities in the optical components induced by the transient stimulated Brillouin scattering are calculated. Through numerical study, the dependence of influence induced by SBS procession on parameters of medium are investigated. ? 2009 IEEE.