文献类型：期刊文献

英文题名：Melt processed perovskite glass-ceramic films for large-area X-ray detection and imaging

作者：Wang, Peng[1];Liu, Da[1];Wei, Zhanpeng[1];Zhao, Yuhao[1];Wang, Haonan[1];Zeng, Sihan[1];Zhu, Yuchen[1];Zheng, Yichu[2];Peng, Yu[1];Hou, Yu[1];Yang, Shuang[1]

机构：[1]East China Univ Sci & Technol, Key Lab Ultrafine Mat, Shanghai Engn Res Ctr Hierarch Nanomat, Sch Mat Sci & Engn,Minist Educ,Shanghai Frontiers, Shanghai 200237, Peoples R China;[2]Shanghai Univ, Sch Mechatron Engn & Automat, Shanghai 200444, Peoples R China

年份：2026

卷号：14

期号：14

起止页码：8272

外文期刊名：JOURNAL OF MATERIALS CHEMISTRY A

收录：;EI(收录号：20260519972664);WOS:【SCI-EXPANDED(收录号:WOS:001668857100001)】；

基金：This work was financially supported by the Scientific Research Innovation Capability Support Project for Young Faculty (SRICSPYF-ZY2025085), the National Key Research and Development Program of China (2025YFA1805600), the National Natural Science Foundation of China (22379044, 52203330), the Shanghai Pilot Program for Basic Research (22TQ1400100-5), the Shanghai Municipal Natural Science Foundation (25ZR1401081), the Fundamental Research Funds for the Central Universities (JKD01251505, JKVD1251041), the Shanghai Engineering Research Center of Hierarchical Nanomaterials (18DZ2252400), the Shanghai Titan Natural Science Development Foundation and the Shanghai Frontiers Science Center of Optogenetic Techniques for Cell Metabolism (Shanghai Municipal Education Commission).

语种：英文

外文关键词：Bromine compounds - Cesium compounds - Composite films - Grain boundaries - Lead compounds - Metal halides - Perovskite - Perovskite solar cells - Semiconducting glass - Thin film circuits - Thin film transistors - Thin films - X ray detectors

摘要：Metal halide perovskites are promising semiconducting materials for sensitive X-ray detection and imaging. However, their incompatibility with thin-film transistor (TFT) backplanes has posed a major challenge to the commercial deployment of perovskite devices. Here, we report perovskite glass-ceramic films comprising (4-EAMP)2Pb3Br10 glass (4-EAMP = 4-(ethylaminomethyl)pyridine) and CsPbBr3 crystals that can be fabricated via a melt-pressing procedure. We found that the glassy phase fills the crystal grain boundaries, which reduces interface defects and suppresses ion migration along the boundaries. These improvements thus enable the composite film to achieve a remarkable mobility-lifetime (mu tau) product of 1.13 x 10-4 cm2 V-1, a high sensitivity of 9.8 x 104 mu C Gyair-1 cm-2, and a low detection limit of 197 nGyair s-1. Compared to pressed perovskite wafers, the adhesive and meltable nature of the glass phase enables seamless integration of the detector with substrates, leading to high-performance X-ray imaging via TFT backplane integration. The demonstrated perovskite glass-ceramic system represents a new kind of semiconductive composite with both excellent processability and optoelectronic properties for integrated optoelectronics.