文献类型：期刊文献

英文题名：Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter

作者：Huang, Di[1];Hua, Xin[2,3];Xiu, Guang-Li[1];Zheng, Yong-Jie[4];Yu, Xiao-Ying[5];Long, Yi-Tao[2,3]

机构：[1]East China Univ Sci & Technol, Sch Resources & Environm Engn, State Environm Protect Key Lab Environm Risk Asse, Shanghai 200237, Peoples R China;[2]East China Univ Sci & Technol, Key Lab Adv Mat, Shanghai 200237, Peoples R China;[3]East China Univ Sci & Technol, Sch Chem & Mol Engn, Shanghai 200237, Peoples R China;[4]Qiqihar Univ, Coll Chem & Chem Engn, Qiqihar 161006, Peoples R China;[5]Pacific Northwest Natl Lab, Earth & Biol Sci Directorate, Richland, WA 99354 USA

年份：2017

卷号：989

起止页码：1

外文期刊名：ANALYTICA CHIMICA ACTA

收录：;EI(收录号：20173104002467);WOS:【SCI-EXPANDED(收录号:WOS:000410343100001)】；

基金：This work was supported by the National Natural Science Foundation of China (grant NOs: 21327807, 21421004 and 21277044). Dr. X.-Y. Yu was supported by the Pacific Northwest National Laboratory (PNNL) Environmental and Biological Science Directorate (EBSD) Mission seed Laboratory Directed Research and Development (LDRD) (68697) fund.

语种：英文

外文关键词：Secondary ion mass spectrometry; Particulate matter; Aerosol; Surface analysis; Chemical heterogeneity

摘要：Currently, considerable attention has been paid to atmospheric particulate matter (PM) investigation due to its importance in human health and global climate change. Surface characterization, single particle analysis and depth profiling of PM is important for a better understanding of its formation processes and predicting its impact on the environment and human being. Secondary ion mass spectrometry (SIMS) is a surface technique with high surface sensitivity, high spatial resolution chemical imaging and unique depth profiling capabilities. Recent research shows that SIMS has great potential in analyzing both surface and bulk chemical information of PM. In this review, we give a brief introduction of SIMS working principle and survey recent applications of SIMS in PM characterization. Particularly, analyses from different types of PM sources by various SIMS techniques were discussed concerning their advantages and limitations. The future development and needs of SIMS in atmospheric aerosol measurement are proposed with a perspective in broader environmental sciences. (C) 2017 Elsevier B.V. All rights reserved.