详细信息

基于TMR阵列的电磁检测系统设计    

Design of Electromagnetic Detection System Based on TMR Array

文献类型:期刊文献

中文题名:基于TMR阵列的电磁检测系统设计

英文题名:Design of Electromagnetic Detection System Based on TMR Array

作者:徐小雄[1];胡明慧[1];张程杰[1]

机构:[1]华东理工大学机械与动力工程学院,上海200237

年份:2021

期号:11

起止页码:48

中文期刊名:仪表技术与传感器

外文期刊名:Instrument Technique and Sensor

收录:CSTPCD;;北大核心:【北大核心2020】;CSCD:【CSCD_E2021_2022】;

基金:国家重点研发计划项目(2018YFC1902404);国家自然科学基金项目(51775188)。

语种:中文

中文关键词:电磁检测;TMR阵列;锁相放大电路;缺陷检测

外文关键词:electromagnetic detection;TMR array;lock-in amplifier circuit;defect detection

摘要:针对钛合金等非铁磁性金属材料的表面及深埋缺陷的快速无损检测需求,基于隧道磁阻(TMR)阵列开发了一套电磁检测系统,设计了频响范围为20 Hz~20 kHz的功率放大电路,使输出电流可以达到0.2 A,设计了锁相放大电路,使其能识别缺陷引起的10^(-6) T感应磁场的变化。通过有限元仿真与实验对比,验证了该电磁检测系统可以准确识别10^(-6) T磁感应强度的变化,实现了对钛合金试块表面缺陷及4 mm下的深埋微缺陷的电磁检测。
In response to the rapid non-destructive testing requirements for the surface and deep-buried defects of non-ferromagnetic metal materials such as titanium alloys,an electromagnetic detection system was designed based on the tunnel magnetoresistance(TMR)array.The power amplifier circuit was designed,which frequency response range was 20 Hz~20 kHz,and output current is about 0.2 A.A phase-locked amplifier circuit was designed to recognize the 10^(-6) T induced magnetic field change caused by the defect.Comparing the finite element simulation with the experiment result,it is verified that the detection system can accurately identify the change of 10^(-6) T magnetic induction intensity,and realize the detection of surface defects of titanium alloy test block and deep buried micro-defects under 4 mm.

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