文献类型：期刊文献

中文题名：绝缘子室温硫化硅橡胶涂层热波模型及其涂覆质量无损检测方法

英文题名：Thermal Wave Model of Room Temperature Vulcanized Silicone Rubber Coating on Insulators and Nondestructive Testing Method for Coating Quality

作者：郭晨鋆[1];刘立帅[2];涂彦昕[3];梅红伟[3];王黎明[3]

机构：[1]云南电网有限责任公司电力科学研究院,昆明650200;[2]华东理工大学承压系统与安全教育部重点实验室,上海200237;[3]清华大学深圳国际研究生院,深圳518055

年份：2022

卷号：37

期号：11

起止页码：2753

中文期刊名：电工技术学报

外文期刊名：Transactions of China Electrotechnical Society

收录：CSTPCD;;Scopus;北大核心:【北大核心2020】；CSCD:【CSCD2021_2022】；

基金：国家重点研发计划(2021YFC3001802);国家自然科学基金(12104155);上海市青年科技英才扬帆计划(21YF1408900);上海市自然科学基金(21ZR1417100)资助项目。

语种：中文

中文关键词：室温硫化硅橡胶;光热辐射热波检测;热波模型;最小相频二次方根倒数;厚度测量

外文关键词：Room temperature vulcanized silicone rubber;photothermal radiometry;thermal wave model;inverse square root of the frequency of minimum phase;thickness measurement

摘要：绝缘子室温硫化硅橡胶(RTV)涂层的涂覆质量是评价其应用效果的重要指标,涂覆施工过程中引入破损、杂质、脱粘、厚度不均匀或不达标等,各种形式缺陷,将严重影响绝缘子外绝缘性能,给设备安全可靠运行带来隐患。该文提出一种基于光热辐射热波检测的RTV涂层涂覆质量无损检测技术,该方法通过分析试件在可控光热激励下的表面瞬态温度场得到其内部结构信息。首先建立绝缘子RTV涂层热波模型并进行求解;对RTV涂层典型缺陷进行了检测,并利用主成分分析和独立成分分析增强缺陷信号;最后从热波响应相位谱中提取最小相频二次方根倒数特征用于定量表征RTV涂层厚度。研究表明,该方法可以实现绝缘子RTV涂层涂覆质量的快速、准确、非接触检测,具有广阔的应用前景。
The quality of room temperature vulcanized silicone rubber(RTV)coating on insulators is an important index for evaluating its application effect.Various kinds of defects introduced during the coating construction process,such as damage,impurities,debonding,uneven thickness,etc.,will seriously deteriorate the insulator's external insulation performance,and bring potential threats to the safe and reliable operation of the equipment.This paper proposes a nondestructive testing technique for RTV coating quality based on photothermal radiometry.This method obtains the internal structure information by analyzing the surface transient temperature field of the specimen after applying thermal excitation.First,the thermal wave model of insulator RTV coating was established and solved;typical defects of RTV coating were detected,and the defect signal was enhanced by principal component analysis and independent component analysis;finally,the inverse square root of the frequency of minimum phase was extracted from the phase spectrum of transient thermal response to quantitatively characterize the RTV coating thickness.Research shows that this method can achieve rapid,accurate,non-contact detection of the quality of insulator RTV coatings,and has broad application prospects.