文献类型：期刊文献

英文题名：Accurate and Efficient Inspection of Speckle and Scratch Defects on Surfaces of Planar Products

作者：Kong, Hui[1];Yang, Jian[1];Chen, Zhihua[2]

机构：[1]Nanjing Univ Sci & Technol, Sch Comp Sci & Engn, Nanjing 210094, Jiangsu, Peoples R China;[2]East China Univ Sci & Technol, Dept Comp Sci & Engn, Shanghai 200237, Peoples R China

年份：2017

卷号：13

期号：4

起止页码：1855

外文期刊名：IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS

收录：;EI(收录号：20173804174210);WOS:【SCI-EXPANDED(收录号:WOS:000406933400036)】；

基金：The work of H. Kong was supported in part by the Jiangsu Province Natural Science Foundation under Grant BK20151491 and in part by the Natural Science Foundation of China under Grant 61672287, and the work of Z. Chen was supported by the National Nature Science Foundation of China under Grants 61370174, 61672228. Paper no. TII-16-1220. (Corresponding authors: Hui Kong and Zhihua Chen.)

语种：英文

外文关键词：Defect detection; image alignment; image matching

摘要：We propose a unified framework for detecting defects in planar industrial products or planar surfaces of nonplanar products based on a template-matching strategy. The framework includes three parts: an automatic selection of template image for a given test one, a robust geometric alignment between template and test images based on an approximate maximum clique approach, and an illumination invariant image comparison method for defect detection in the aligned images. Experimental results on challenging image datasets demonstrate the excellent performance of the proposed framework.