文献类型：期刊文献

英文题名：A New Probabilistic Ellipse Imaging Method Based on Adaptive Signal Truncation for Ultrasonic Guided Wave Defect Localization on Pressure Vessels

作者：Li, Qinfei[1];Luo, Zhi[1];Hu, Gangyi[1];Zhou, Shaoping[1]

机构：[1]East China Univ Sci & Technol, Sch Mech & Power Engn, Shanghai 200237, Peoples R China

年份：2022

卷号：22

期号：4

外文期刊名：SENSORS

收录：;EI(收录号：20220711650991);WOS:【SCI-EXPANDED(收录号:WOS:000764362300001)】；

基金：FundingThis research was funded by Natural Science Foundation of China, Grant No. 52175137.

语种：英文

外文关键词：pressure vessel; ultrasonic guided wave; defect location; signal analysis; probabilistic elliptic algorithm; adaptive signal truncation

摘要：Pressure vessels are prone to defects due to environmental conditions, which may cause serious safety hazards to industrial production. The probabilistic ellipse imaging method, based on ultrasonic guided wave, is a common method for locating defects on plate-like structures. In this paper, the research showed that the accuracy of the traditional probabilistic ellipse imaging method was severely affected by the truncation length of the signal. In order to improve the defect location accuracy of the probabilistic elliptic imaging algorithm, an adaptive signal truncation method based on signal difference analysis was proposed, and a novel probabilistic elliptic imaging method was developed. Firstly, the relationship model between the signal difference coefficient (SDC) and the distance coefficient was constructed. Through this model, the distance coefficient of each group signal can be calculated, so that the adaptive truncation length for each group of signals can be determined and the truncated signals used for defect imaging. Secondly, in order to improve the robustness of the new imaging method, the relationship between the defect location accuracy and SDC thresholds were investigated and the optimal threshold was determined. The experimental results showed that the probabilistic ellipse imaging algorithm, based on the new adaptive signal truncation method, can effectively locate a single defect on a pressure vessel.