文献类型：期刊文献

中文题名：表面活性剂对二次雾化袋状破裂特性的影响

英文题名：Influence of Surfactant on Secondary Atomization in the Bag Breakup Regime

作者：吴炬晖[1];章文斌[1];赵辉[1];李伟锋[1];许建良[1];刘海峰[1]

机构：[1]华东理工大学煤气化及能源化工教育部重点实验室,上海煤气化工程技术研究中心,上海200237

年份：2016

卷号：42

期号：3

起止页码：329

中文期刊名：华东理工大学学报(自然科学版)

外文期刊名：Journal of East China University of Science and Technology

收录：CSTPCD;;Scopus;北大核心:【北大核心2014】；CSCD:【CSCD2015_2016】；

基金：国家自然科学基金资助项目(U1402272);上海自然科学基金资助项目(15ZR1409500);中央高校基本科研业务费(WB1514074,WB1514076)

语种：中文

中文关键词：表面活性剂;表面张力;破裂形态;二次雾化;液滴

外文关键词：surfactant;surface tension;morphology;secondary atomization;liquid droplet

摘要：以表面活性剂水溶液为液相介质、空气为气相介质,采用高速摄像机研究表面活性剂对二次雾化破裂性质的影响,重点阐述了破裂形变特征上的变化。研究结果表明:在形变特征方面,临界胶束浓度(CMC)对二次雾化袋状破裂形态有着重要影响,除了最大液滴直径形变率(d_(f,m)/d_(0))基本不变,保持在1.64左右外,最大液环直径形变率(d_(r,m)/d_(0))、最大轴向生长率(l_(m)/d_(0))、最大径向生长率(h_(m)/d_(0))和长宽比(l_(m)/h_(m))等在表面活性剂质量分数小于CMC时均变化迅速,但在表面活性剂质量分数大于CMC后变化趋于平缓,d_(r,m)/d_(0)稳定在4.16左右,l_(m)/d_(0)稳定在6.36左右,l_(m)/h_(m)稳定在1.53左右。
The influence of surfactant on secondary atomization in the bag breakup regime of surfactant solution was studied experimentally by high-speed camera using aqueous surfactant solution as liquid medium and atmosphere as gas medium.The change of deformation and time characteristics were elaborated.The results showed that,in the aspect of deformation characteristics,as a crucial parameter of surfactant,the critical micelle concentration(CMC)has an important effect on secondary atomization;all deformation parameters like maximum dimensionless rim diameters(d_(r,m)/d_(0)),radial length(l_(m)/d_(0)),axial length(h_(m)/d_(0)),length-width ratio(l_(m)/h_(m))of bag changed fast except that the largest droplet diameter deformation rate kept about 1.64 when the surfactant concentration was below the CMC.However,the variation of these parameters turned to be steady when the surfactant concentration exceeded the CMC.dr.m/do stabilized at about 4.16,lm/do stabilized at about 6.36,and lm/hm stabilized at about 1.53.