文献类型：期刊文献

英文题名：Quantitative determination of trace metals in high-purity silicon carbide powder by laser ablation inductively coupled plasma mass spectrometry without binders

作者：Zhou, Hui[1,2,3];Wang, Zheng[1];Zhu, Yan[1];Li, Qing[1,2,3];Zou, Hui-Jun[1];Qu, Hai-Yun[1];Chen, Yi-Rui[1];Du, Yi-Ping[2,3]

机构：[1]Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 200050, Peoples R China;[2]E China Univ Sci & Technol, Shanghai Key Lab Funct Mat Chem, Shanghai 200237, Peoples R China;[3]E China Univ Sci & Technol, Res Ctr Anal & Test, Shanghai 200237, Peoples R China

年份：2013

卷号：90

起止页码：55

外文期刊名：SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

收录：;EI(收录号：20134817033420);WOS:【SCI-EXPANDED(收录号:WOS:000328912800003)】；

基金：The financial support of the Development and Innovation of Instrument Functions, CAS (No. Y27YQ3120G), the Key Program of Creative Funding of SICCAS and the support of the chromatography and mass division of Thermo Fisher Scientific are acknowledged.

语种：英文

外文关键词：Inductively coupled plasma mass spectrometry; Laser ablation; Silicon carbide powder; Calibration; Relative sensitivity factor

摘要：We have developed a laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) method to directly determine the concentrations of trace metals in high-purity powdery silicon carbide (SiC) samples. The sample preparation procedure is simple and rapid. The sample was formed into pellets using no binders and heated at 1000 degrees C for 2 h. The operation parameters for LA and ICP-MS were optimized to achieve a table signal intensity and high sensitivity. National Institute of Standards and Technology Standard Reference Materials glasses were chosen as calibration standards, with Si-29 chosen as the internal standard. The relative sensitivity factor obtained from the glass matrix was used to calculate the concentrations of analytes in the SiC ceramic samples. The regression correlation coefficients of the calibration curves for elements with internal standard correction ranged from 0.9981 to 0.9999, which are better than those obtained with an external standard correction method only. The relative standard deviation of the measured trace element concentrations was less than 5%. The limits of detection were 0.02, 0.08, 0.04, 0.005, 0.01, 0.02, 0.004, 0.07, and 0.006 mg kg(-1) for B, Ti, Cr, Mn, Fe, Ni, Co, Cu, and Sr, respectively. The method was applied to analyze SiC samples with two different particle sizes. The analysis showed good agreement with the results of inductively coupled plasma optical emission spectrometry. The reliability of the proposed method was confirmed by determining the contents of B, Ti, Cr, Mn, Fe, Ni, and Cu in BAM-S003. (C) 2013 Elsevier B.V. All rights reserved.