成果/Result
- Continuous-scan capability at SSRL and applications to X-ray diffraction被引量：2收藏
- 作者：Li, Chunlei Kiss, Andrew M. Van Campen, Douglas G. Garachtchenko, Alex Kolotovsky, Yuriy Stone, Kevin Xu, Yahong Zhang, Wenjun Corbett, Jeff
- 机构：East China Univ Sci & Technol;SLAC Natl Accelerator Lab;Donghua Univ;Univ Saskatchewan
- 来源：JOURNAL OF SYNCHROTRON RADIATION 2016
- 关键词：continuous scan step scan X-ray diffraction efficiency
