成果/Result
- Electro-Thermal-Stress Breakdown Analysis of GaAs p-i-n Diodes Under Ka-Band High-Power Microwave Pulse Injection被引量：0收藏
- 作者：Zhang, Yue Zhou, Liang Ma, Xinyu Huang, Jingwen Li, Mingxuan Liu, Yadong
- 机构：East China Univ Sci & Technol;Shanghai Jiao Tong Univ;Shanghai Jiao Tong Univ
- 来源：IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 2026
- 关键词：P-i-n diodes Ka-band Human factors Stress Gallium arsenide Thermal stresses Diodes PIN photodiodes Temperature Electric breakdown Gallium arsenide (GaAs) positive-intrinsic-negative (p-i-n) technology high-power capacity high-power microwave (HPM) intentional electromagnetic interference (IEMI) Ka-band limiter round rectangular the electro-thermal-stress effect
- Investigation on ElectricalThermal-Stress Failure of GaN HEMTs Under High-Power Microwave-Induced Pulse Injection被引量：0收藏
- 作者：Zhang, Yue Huang, Jingwen Zhou, Liang Ma, Xinyu Li, Mingxuan
- 机构：East China Univ Sci & Technol;Shanghai Jiao Tong Univ
- 来源：IEEE TRANSACTIONS ON ELECTRON DEVICES 2026
- 关键词：MODFETs HEMTs Logic gates Gallium nitride Thermal analysis Semiconductor device measurement Pulse measurements Frequency measurement Temperature distribution Power measurement Electrical-thermal-stress effect gallium nitride (GaN) high-electron mobility transistors (HEMTs) high-power microwave (HPM) intentional electromagnetic interference (IEMI) thermal accumulation effect
- A Compact Broadband Transition From Ground Coplanar Waveguide to Folded SIW被引量：0收藏
- 作者：Ji, Lei Xu, Qihao Zhang, Yue Li, Xiao-Chun
- 机构：Shanghai Jiao Tong Univ;East China Univ Sci & Technol
- 来源：IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS 2026
- 关键词：Metals Impedance Transformers Waveguide transitions Bandwidth Substrates Coplanar waveguides Loss measurement Broadband communication Reflection coefficient Broadband coplanar waveguide ground coplanar waveguide (GCPW) to folded substrate-integrated waveguide (FSIW) transition slow wave effect (SW) tapered strip line (TSL)
